Machine learning-based embedded systems for safety-critical applications, such as aerospace and autonomous driving, must be robust to perturbations caused by soft errors. As transistor geometries shrink and voltages decrease, modern electronic devices become more susceptible to background radiation, increasing the concern about failures produced by soft errors. The resilience of deep neural networks (DNNs) to these errors depends not only on target device technology but also on model structure and the numerical representation and arithmetic precision of their parameters. Compression techniques like pruning and quantization, used to reduce memory footprint and computational complexity, alter both model structure and representation, affecting soft error robustness. In this regard, although often overlooked, the choice of activation functions (AFs) impacts not only accuracy and trainability but also compressibility and error resilience. This paper explores the use of bounded AFs to enhance robustness against parameter perturbations, while evaluating their effects on model accuracy, compressibility, and computational load with a technology-agnostic approach. We focus on encoder-decoder convolutional models developed for semantic segmentation of hyperspectral images with application to autonomous driving systems.

The rising incidence of soft errors in hardware systems represents a considerable risk to the reliability of deep learning systems and can precipitate severe malfunctions. Although essential, soft error mitigation can impose substantial costs on deep learning systems that are inherently demanding in terms of computation and memory. Previous research has primarily explored variations in vulnerability among different components of computing engines or neural networks, aiming for selective protection to minimize protection overhead. Our approach diverges from these studies by recognizing that the susceptibility of deep learning tasks to soft errors is heavily input-dependent. Notably, some inputs are simpler for deep learning models and inherently exhibit greater tolerance to soft errors. Conversely, more complex inputs are prone to soft error impact. Based on these insights, we introduce an adaptive soft error protection strategy that tailors protection to the computational demands of individual inputs. To implement this strategy, we develop a metric for assessing the complexity of inputs and deploy a lightweight machine learning algorithm to gauge input difficulty. Subsequently, we employ robust protection for challenging inputs and minimal protection for simpler ones. Our experimental evaluation across diverse datasets and deep learning tasks reveals that our adaptive strategy reduces the soft error protection overhead by an average of 46.9%, without compromising system reliability.

As transformer-based object detection models progress, their impact in critical sectors like autonomous vehicles and aviation is expected to grow. Soft errors causing bit flips during inference have significantly impacted DNN performance, altering predictions. Traditional range restriction solutions for CNNs fall short for transformers. This study introduces the Global Clipper and Global Hybrid Clipper, effective mitigation strategies specifically designed for transformer-based models. It significantly enhances their resilience to soft errors and reduces faulty inferences to ~ 0\%. We also detail extensive testing across over 64 scenarios involving two transformer models (DINO-DETR and Lite-DETR) and two CNN models (YOLOv3 and SSD) using three datasets, totalling approximately 3.3 million inferences, to assess model robustness comprehensively. Moreover, the paper explores unique aspects of attention blocks in transformers and their operational differences from CNNs.

The wide adoption of Large language models (LLMs) makes their dependability a pressing concern. Detection of errors is the first step to mitigating their impact on a system and thus, efficient error detection for LLMs is an important issue. In many settings, the LLM is considered as a black box with no access to the internal nodes; this prevents the use of many error detection schemes that need access to the model's internal nodes. An interesting observation is that the output of LLMs in error-free operation should be valid and normal text. Therefore, when the text is not valid or differs significantly from normal text, it is likely that there is an error. Based on this observation we propose to perform Concurrent Linguistic Error Detection (CLED); this scheme extracts some linguistic features of the text generated by the LLM and feeds them to a concurrent classifier that detects errors. Since the proposed error detection mechanism only relies on the outputs of the model, then it can be used on LLMs in which there is no access to the internal nodes. The proposed CLED scheme has been evaluated on the T5 model when used for news summarization and on the OPUS-MT model when used for translation. In both cases, the same set of linguistic features has been used for error detection to illustrate the applicability of the proposed scheme beyond a specific case. The results show that CLED can detect most of the errors at a low overhead penalty. The use of the concurrent classifier also enables a trade-off between error detection effectiveness and its associated overhead, so providing flexibility to a designer.

Winograd is generally utilized to optimize convolution performance and computational efficiency because of the reduced multiplication operations, but the reliability issues brought by winograd are usually overlooked. In this work, we observe the great potential of winograd convolution in improving neural network (NN) fault tolerance. Based on the observation, we evaluate winograd convolution fault tolerance comprehensively from different granularities ranging from models, layers, and operation types for the first time. Then, we explore the use of inherent fault tolerance of winograd convolution for cost-effective NN protection against soft errors. Specifically, we mainly investigate how winograd convolution can be effectively incorporated with classical fault-tolerant design approaches including triple modular redundancy (TMR), fault-aware retraining, and constrained activation functions. According to our experiments, winograd convolution can reduce the fault-tolerant design overhead by 55.77\% on average without any accuracy loss compared to standard convolution, and further reduce the computing overhead by 17.24\% when the inherent fault tolerance of winograd convolution is considered. When it is applied on fault-tolerant neural networks enhanced with fault-aware retraining and constrained activation functions, the resulting model accuracy generally shows significant improvement in presence of various faults.

Soft errors in large VLSI circuits pose dramatic influence on computing- and memory-intensive neural network (NN) processing. Understanding the influence of soft errors on NNs is critical to protect against soft errors for reliable NN processing. Prior work mainly rely on fault simulation to analyze the influence of soft errors on NN processing. They are accurate but usually specific to limited configurations of errors and NN models due to the prohibitively slow simulation speed especially for large NN models and datasets. With the observation that the influence of soft errors propagates across a large number of neurons and accumulates as well, we propose to characterize the soft error induced data disturbance on each neuron with normal distribution model according to central limit theorem and develop a series of statistical models to analyze the behavior of NN models under soft errors in general. The statistical models reveal not only the correlation between soft errors and NN model accuracy, but also how NN parameters such as quantization and architecture affect the reliability of NNs. The proposed models are compared with fault simulation and verified comprehensively. In addition, we observe that the statistical models that characterize the soft error influence can also be utilized to predict fault simulation results in many cases and we explore the use of the proposed statistical models to accelerate fault simulations of NNs. According to our experiments, the accelerated fault simulation shows almost two orders of magnitude speedup with negligible simulation accuracy loss over the baseline fault simulations.

Specialized hardware accelerators have been designed and employed to maximize the performance efficiency of Spiking Neural Networks (SNNs). However, such accelerators are vulnerable to transient faults (i.e., soft errors), which occur due to high-energy particle strikes, and manifest as bit flips at the hardware layer. These errors can change the weight values and neuron operations in the compute engine of SNN accelerators, thereby leading to incorrect outputs and accuracy degradation. However, the impact of soft errors in the compute engine and the respective mitigation techniques have not been thoroughly studied yet for SNNs. A potential solution is employing redundant executions (re-execution) for ensuring correct outputs, but it leads to huge latency and energy overheads. Toward this, we propose SoftSNN, a novel methodology to mitigate soft errors in the weight registers (synapses) and neurons of SNN accelerators without re-execution, thereby maintaining the accuracy with low latency and energy overheads. Our SoftSNN methodology employs the following key steps: (1) analyzing the SNN characteristics under soft errors to identify faulty weights and neuron operations, which are required for recognizing faulty SNN behavior; (2) a Bound-and-Protect technique that leverages this analysis to improve the SNN fault tolerance by bounding the weight values and protecting the neurons from faulty operations; and (3) devising lightweight hardware enhancements for the neural hardware accelerator to efficiently support the proposed technique. The experimental results show that, for a 900-neuron network with even a high fault rate, our SoftSNN maintains the accuracy degradation below 3%, while reducing latency and energy by up to 3x and 2.3x respectively, as compared to the re-execution technique.

AIoT processors fabricated with newer technology nodes suffer rising soft errors due to the shrinking transistor sizes and lower power supply. Soft errors on the AIoT processors particularly the deep learning accelerators (DLAs) with massive computing may cause substantial computing errors. These computing errors are difficult to be captured by the conventional training on general purposed processors like CPUs and GPUs in a server. Applying the offline trained neural network models to the edge accelerators with errors directly may lead to considerable prediction accuracy loss. To address the problem, we propose a remote retraining framework (R2F) for remote AIoT processors with computing errors. It takes the remote AIoT processor with soft errors in the training loop such that the on-site computing errors can be learned with the application data on the server and the retrained models can be resilient to the soft errors. Meanwhile, we propose an optimized partial TMR strategy to enhance the retraining. According to our experiments, R2F enables elastic design trade-offs between the model accuracy and the performance penalty. The top-5 model accuracy can be improved by 1.93%-13.73% with 0%-200% performance penalty at high fault error rate. In addition, we notice that the retraining requires massive data transmission and even dominates the training time, and propose a sparse increment compression approach for the data transmission optimization, which reduces the retraining time by 38%-88% on average with negligible accuracy loss over a straightforward remote retraining.

Over past years, the easy accessibility to the large scale datasets has significantly shifted the paradigm for developing highly accurate prediction models that are driven from Neural Network (NN). These models can be potentially impacted by the radiation-induced transient faults that might lead to the gradual downgrade of the long-running expected NN inference accelerator. The crucial observation from our rigorous vulnerability assessment on the NN inference accelerator demonstrates that the weights and activation functions are unevenly susceptible to both single-event upset (SEU) and multi-bit upset (MBU), especially in the first five layers of our selected convolution neural network. In this paper, we present the relatively-accurate statistical models to delineate the impact of both undertaken SEU and MBU across layers and per each layer of the selected NN. These models can be used for evaluating the error-resiliency magnitude of NN topology before adopting them in the safety-critical applications.

Over past years, the philosophy for designing the artificial intelligence algorithms has significantly shifted towards automatically extracting the composable systems from massive data volumes. This paradigm shift has been expedited by the big data booming which enables us to easily access and analyze the highly large data sets. The most well-known class of big data analysis techniques is called deep learning. These models require significant computation power and extremely high memory accesses which necessitate the design of novel approaches to reduce the memory access and improve power efficiency while taking into account the development of domain-specific hardware accelerators to support the current and future data sizes and model structures. The current trends for designing application-specific integrated circuits barely consider the essential requirement for maintaining the complex neural network computation to be resilient in the presence of soft errors. The soft errors might strike either memory storage or combinational logic in the hardware accelerator that can affect the architectural behavior such that the precision of the results fall behind the minimum allowable correctness. In this study, we demonstrate that the impact of soft errors on a customized deep learning algorithm called Binarized Neural Network might cause drastic image misclassification. Our experimental results show that the accuracy of image classifier can drastically drop by 76.70% and 19.25% in lfcW1A1 and cnvW1A1 networks, respectively across CIFAR-10 and MNIST datasets during the fault injection for the worst-case scenarios.